中華人民共和國國家標準(中國大陸GB標準)英文版

GB標準是中華人民共和國國家標準,也叫GB國標,是中國大陸強制執行的國家標準,所有中國大陸境內銷售的商品及提供服務都必須符合GB國家標準的要求,包括進口商品及服務; 本網站提供GB國家標準的查詢檢索,英文版翻譯,GB標準產品檢測檢驗及合規性分析服務;
       
GB/T 43512-2023
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Reliability evaluation method of all-vanadium redox flow battery
 
GB/T 43511-2023
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Rail transit electric traction overhead rigid catenary
 
GB/T 43509-2023
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Technical requirements for energy Internet trading platform
 
GB/T 43508-2023
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General technical requirements for integrated rice and fishery planting and breeding
 
GB/T 43507-2023
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Guidelines for the Construction of County Basic Public Service Standard System
 
GB/T 43506-2023
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Telecommunications and Internet Services Technical Requirements for User Personal Information Protection
 
GB/T 43505-2023
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Ceramic lined oil pipe
 
GB/T 43504-2023
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Flight performance flight test requirements for large and medium-sized civilian fixed-wing UAVs
 
GB/T 43503-2023
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Natural gas - Determination of oxygen content - Electrochemical method
 
GB/T 43502.1-2023
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Natural gas - Determination of particulate matter - Part 1: Determination of particle size distribution by optical methods
 
GB/T 43501-2023
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Ships and Offshore Technology - Vibration measurement, evaluation and reporting guidelines for habitability of ships with specific characteristics
 
GB/T 43499-2023
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Motor vehicle detection system software testing method
 
GB/T 43498-2023
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Pipeline erosion and corrosion test method
 
GB/T 43497-2023
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Electrodeposition layer and related finishing Electroless nickel phosphorus-ceramic composite coating
 
GB/T 43496-2023
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Detection methods for thermal cycle and condensation of building curtain walls
 
GB/T 43495-2023
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Application classification of radio frequency identification (RFID) electronic tags for tires
 
GB/T 43494-2023
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Radio frequency identification (RFID) electronic tag encoding for tires
 
GB/T 43493.3-2023
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Semiconductor devices - Non-destructive testing and identification criteria for defects in silicon carbide homoepitaxial wafers for power devices - Part 3: Photoluminescence detection method of defects
 
GB/T 43493.2-2023
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Semiconductor devices - Non-destructive testing and identification criteria for defects in silicon carbide homoepitaxial wafers for power devices - Part 2: Optical detection methods for defects
 
GB/T 43493.1-2023
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Semiconductor devices - Non-destructive testing and identification criteria for defects in silicon carbide homoepitaxial wafers for power devices - Part 1: Defect classification
 

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