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中華人民共和國國家標準(中國大陸GB標準)英文版 |
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GB標準是中華人民共和國國家標準，也叫GB國標，是中國大陸強制執行的國家標準，所有中國大陸境內銷售的商品及提供服務都必須符合GB國家標準的要求，包括進口商品及服務； 本網站提供GB國家標準的查詢檢索，英文版翻譯，GB標準產品檢測檢驗及合規性分析服務； |
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GB/T 24581-2009 ??????????????????III?V??????????（中英文版） Test method for low temperature FT-IR analysis of single crystal silicon for ?-? impurities |
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GB/T 24580-2009 ??n???????????????????（中英文版） Test method for measuring boron contamination in heavily doped n-type silicon substrates by secondary ion mass spectrometry |
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GB/T 24579-2009 ??? ???????????????????（中英文版） Test method for measuring surface metal contamination of polycrystalline silicon by acid extraction-atomic absorption spectroscopy |
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GB/T 1555-2009 ???????????（中英文版） Testing methods for determining the orientation of a semiconductor single crystal |
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GB/T 1554-2009 ????????????????（中英文版） Testing method for crystallographic perfection of silicon by preferential etch techniques |
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GB/T 1553-2009 ????????????????????（中英文版） Test methods for minority carrier lifetime in bulk germanium and silicon by measurement of photoconduetivity decay |
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GB/T 1551-2009 ??????????（中英文版） Test method for measuring resistivity of monocrystal silicon |
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GB/T 14264-2009 ???????（中英文版） Semiconductor materials-terms and definitions |
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GB/T 14146-2009 ??????????? ?????-???（中英文版） Silicon epitaxial layers-determination of carrier concentration-mercury probe voltages-capacitance method |
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GB/T 14144-2009 ?????????????????（中英文版） Testing method for determination of radial interstitial oxygen variation in silicon |
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GB/T 14141-2009 ????????????????????? ??????（中英文版） Test method for sheet resistance of silicon epitaxial, diffused and ion-implanted layers using a collinear four-probe array |
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GB/T 14140-2009 ????????（中英文版） Test method for measuring diameter of semiconductor wafer |
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GB/T 14139-2009 ????（中英文版） Silicon epitaxial wafers |
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GB/T 13388-2009 ??????????X??????（中英文版） Method for measuring crystallographic orientation of flats on single-crystal silicon slices and wafers by X-ray techniques |
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GB/T 13387-2009 ???????????????????（中英文版） Test method for measuring flat length wafers of silicon and other electronic materials |
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GB/T 11072-2009 ????????????（中英文版） Indium antimonide polycrystal,single crystals and as-cut slices |
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GB/T 1558-2009 ????????? ????????（中英文版） Test method for substitutional atomic carbon concent of silicon by infrared absorption |
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GB/T 10118-2009 ???（中英文版） High purity gallium |
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GB/T 10117-2009 ???（中英文版） High purity antimonium |
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GB 24568-2009 ?????????（中英文版） Calcium hydrogen phosphate for tooth-paste industry |
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