中華人民共和國國家標準
NATIONAL
STANDARD OF THE PEOPLE'S REPUBLIC OF CHINA
GB/T 32281-2015
Test method for measuring oxygen, carbon, boron and phosphorus in solar silicon wafers and feedstock by secondary ion mass spectrometry 太陽能級矽片和矽料中氧、碳、硼和磷量的測定 二次離子質譜法
Issued Date:2015-12-10
Implemented Date:2017-01-01
Issued by:
The Standardization Administration of the People's Republic of China