中华人民共和国国家标准
NATIONAL
STANDARD OF THE PEOPLE'S REPUBLIC OF CHINA
GB/T 27760-2011
Test method for calibrating the z-magnification of an atomic force microscope at subnanometer displacement levels using si (111) monatomic steps 利用Si(111)晶面原子台阶对原子力显微镜亚纳米高度测量进行校准的方法
Issued Date:2011-12-30
Implemented Date:2012-05-01
Issued by:
The Standardization Administration of the People's Republic of China